01/01/1996 09:00 AM
Computer Engineering
In this paper, we for the first time present experimental evidence that the die surface can act as an RC interconnect, becoming an important factor in determining the voltage of a floating wire created by a CMOS open. We present a circuit model for this effect verified with HSPICE simulations. A detailed analysis of potential mechanisms behind this phenomenon is provided. We also present our measurement results for the trapped charge deposited on floating gates during fabrication.
