08/01/1991 09:00 AM
Computer Engineering
Two approaches have been used to balance the cost of generating effective tests for ICs and the need to increase the ICs\' quality level. The first approach favors using high-level fault models to reduce test generation costs at the expense of test quality, and the second approach favors the use of low-level, technology-specific fault models to increase defect coverage but lead to unacceptably high test generation costs. In this report we (1) present the results of simulations of complete single stuck-at test sets against a low-level model of bridge defects showing that an unacceptably high percentage of such defects are not detected by the complete stuck-at test sets; (2) show how low-level bridge fault models can be incorporated into high-level test generation; and (3) describe our system for generating effective tests for bridge faults and report on its performance.
