04/01/1995 09:00 AM
Computer Engineering
Inductive fault analysis seeks to improve the effectiveness of circuit testing by determining which faults are most likely to occur as the result of common manufacturing defects, and focusing testing efforts on these faults. In current circuit fabrication proocesses, the most common spot defects cause bridges and breaks. We present an efficient plane sweep algorithm for calculating the critical area of possible breaks in rectilinear circuit layouts. The algorithm has been integrated with an existing program, Carafe, that previously only performed extraction of likely bridges. Carafe was used to analyze the occurrence of breaks in benchmark circuits; the results of this analysis are presented. Notes: Master\'s Thesis
